Аналитические приборы и лабораторное оборудование, газовые хроматографы, хромато-масс-спектрометры, газохроматографические анализаторы, приборы для ВЭЖХ, высокоэффективные жидкостные хроматографы, препаративные жидкостные хроматографы, ИК-Фурье спектрометры, Рамановские спектрометры, БИК спектрометры, промышленные БИК анализаторы пищевых продуктов, УФ спектрофотометры, флуориметры, спектрофлуориметры, атомно-абсорбционные спектрофотометры, элементные анализаторы, рентгенофлуоресцентные спектрометры для анализа металла, оптико-эмиссионные анализаторы элементного состава металлов, сплавов, спектрометры ИСП, масс-спектрометры, газоаналитические приборы, масс-спектрометрические газоанализаторы.
Manufacturers and suppliers of surface analysis equipment, surface analysis instrumentation, surface microanalysis, microspectroscopy instrumentation (FTIR microscopes, Raman microscope and imaging systems, fluorescence analytical microscopes, fluorescence microspectrometers, X-ray fluorescence microspectrometers, XRF microscopes, scanning electron microscopes, scanning probe microscopes, atomic force microscopes, transmission electron microscopes, electron probe microanalyzers, electron backscatter diffraction, EBSD, EDS microanalysis and imaging instruments for analytical SEM, TEM systems, EELS, electron energy loss spectrometers, Auger spectrometers, XPS, X-ray photoelectron spectrometers, secondary ion mass spectrometers, SIMS microprobe analyzers, microhardness testers, nanoindentors). Производители и поставщики оборудования, приборов для анализа   состава и микроструктуры поверхности образца (аналитические ИК-Фурье микроскопы, Рамановские микроскопы, флуоресцентные микроскопы, рентгенофлуоресцентные аналитические микроскопы, растровые, сканирующие, электронные микроскопы, сканирующие зондовые микроскопы, атомно-силовые микроскопы, микрозонды, просвечивающие электронные микроскопы, приборы для анализа дифракции отражённых электронов, элементного картирования, Оже спектрометры, рентгеновские фотоэлектронные спектрометры, масс-спектрометры вторичных ионов для точечного анализа поверхности материалов, микротвердомеры, наноинденторы).
Manufacturers and suppliers of scanning probe microscopes (SPM systems), atomic force microscopes (AFM systems). Производители и поставщики сканирующих зондовых микроскопов, атомно-силовых микроскопов.
International companies index. Международный указатель компаний.
Bruker Corporation.
Bruker is a manufacturer of quadrupole, ITD, TOF mass-spectrometers, GC/MS, MS/MS, LC/MS/MS systems, FTIR, FT-NIR, Raman spectrometers, NMR, EPR spectrometers, NMR analyzers, X-ray fluorescence spectrometers, portable XRF analyzers, X-ray diffractometers, single crystal diffraction instruments (XRD, SCD systems), spark-OES metal analyzers, combustion elemental analyzers, portable ion mobility spectrometers, portable FTIR analyzers, biological, chemical and nuclear detection instruments. Bruker Scientific Instruments Division (Bruker AXS, Bruker BioSpin, Bruker Daltonics, Bruker Optics) offers a broad range of instruments and solutions for analytical chemistry, life sciences, clinical research, materials research, environmental analysis, forensics, lab automation, process control, quality control.
Bruker AXS manufactures a broad range of X-ray fluorescence spectrometers for quantitative elemental analysis, portable XRF spectrometers (handheld XRF analyzers), X-ray fluorescence microanalysis instruments (micro-XRF spectrometers, X-ray microanalysis systems), X-ray diffraction instruments, single crystal diffraction systems (SCD systems), and X-ray components (X-ray sources, detectors, X-ray optics). Bruker AXS also manufactures sparc optical emission spectrometers for metal analysis (spark OES metal analyzers) and combustion analyzers for metals. Bruker AXS manufactures atomic force microscopes / scanning probe microscopes (AFM/SPM systems). Bruker AXS offers radionuclide spectrometers.
Bruker Optics manufactures research FT-IR spectrometers, FT-NIR spectometers, Raman spectrometers, FT-Raman and FT-IR microscopes, process FT-NIR analyzers, time domain low resolution NMR spectrometers (low resolution benchtop NMR analyzers for QC/QA), terahertz spectrometers, imaging spectrograph and scanning monochromator. Bruker Optics manufactures specialized FT-NIR spectrometers for a wide range of NIR applications in QA/QC and process control, FT-NIR spectrometer for in-line process control with non-contact analysis capabilities. Bruker Optics offers high resolution FT-Raman spectrometers for both research and process control solutions, process Raman systems, FT-Raman microscopes for non-destructive analysis of microscopic samples. Bruker Optics manufactures automated infrared detection system for real-time remote sensing of atmospheric compounds.
CAMECA.
CAMECA (France) is a manufacturer of surface microanalysis and elemental mapping instruments for research, materials science, geology, geosciences, semiconductors, and metrology equipment for semiconductor industry. CAMECA is a business unit of the AMETEK Materials Analysis Division. CAMECA manufactures low energy X-ray emission spectrometry systems, SIMS microprobe analyzers, secondary ion mass spectrometry systems for semiconductors materials science and geosciences, EPMA, electron probe microanalysis systems for materials science and geosciences, laser assisted tomographic atom probe microanalysis and imaging systems for materials and semiconductors. The CAMECA instruments provide elemental and isotopic composition data from micron down to sub-nanometer scale. The company manufactures a broad range of secondary ion mass spectrometers for surface microanalysis: universal magnetic sector SIMS system for materials and semiconductors, magnetic sector SIMS system for advanced semiconductors, magnetic sector SIMS system for geoscience laboratories, ultra high sensitivity magnetic sector SIMS system for geoscience labs, high performance SIMS system for isotopic and trace element analysis at high spatial resolution, universal quadrupole SIMS system for semiconductors and materials, shielded magnetic sector SIMS system for radioactive samples (on request). CAMECA manufactures laser assisted tomographic atom probe microanalysis and imaging system providing quantitative atomic scale 3D elemental mapping of chemical heterogeneities in materials. Laser assisted tomographic atom probe microanalysis and imaging system features atomic scale depth resolution in semiconductors, excellent mass resolution even on low thermal conductivity materials, large area of analysis (up to 100 nm in diameter) for a better statistics on composition measurements, flexible and fast dedicated FIM (field ion microscopy) detector for metallurgical applications. CAMECA manufactures electron probe microanalysis system (EPMA system) for materials science and geosciences. Electron probe microanalysis system featured fully integrated optical microscope, up to 5 wavelength dispersive spectrometers (WDXRF spectrometers), + energy dispersive spectrometer (EDXRF spectrometer), high voltage electron gun operates at up to 40 kV for elements with high atomic number, trace element measurements and high speed X-ray mapping. Also manufactures shielded electron probe microanalysis system for radioactive samples. Electron probe microanalyzer system are equipped with a complete kit of built-in microscopy tools that allow simultaneous X-ray (WDXRF and EDXRF), SEM and BSE imaging. CAMECA manufatures process control systems for the semiconductor manufacturing industry (metrology tools): in-line low energy X-ray emission spectrometer system, near-line full wafer magnetic sector SIMS analyzer, automated, full wafer quadrupole SIMS analyzer.
JEOL Ltd.
JEOL Ltd is a manufacturer of transmission electron microscopes (TEM systems), scanning electron microscopes (SEM systems), electron probe micro analyzers (EPMA), Auger microprobe analyzers (AES), scanning probe microscopes (SPM systems), X-Ray  photoelectron spectrometers (XPS systems), nuclear magnetic resonance spectometers, electron spin resonance spectormeters, mass-spectrometers, MS/MS, GC/MS systems, LC/MS systems, X-ray fluorescence spectrometers, amino acid analyzers, clinical biochemistry analyzers, laboratory information systems. JEOL manufactures a broad range of electron microscopes and surface microanalysis instruments, including: transmission electron microscopes, scanning electron microscopes, analytical scanning electron microscopes (SEM + optional energy dispersive X-ray spectrometer, EDS for elemental analysis), scanning probe microscopes, field emission Auger microprobe analyzers, electron probe microanalyzers (EPMA, up to 5 energy dispersive X-ray spectrometers for elemental analysis), X-Ray photoelectron spectrometers. JEOL manufactures double-focusing magnetic sector mass spectrometers and MS-MS systems, dioxin analysis MS system, magnetic sector GC-MS system, quadrupole GC-MS system, TOF GC-MS system, and TOF API HPLC-MS system. JEOL manufactures high performance, research grady nuclear magnetic resonance spectometers, electron spin resonance spectormeters (high resolution NMR spectrometers, ESR spectrometers). JEOL manufactures X-ray fluorescence spectrometers (XRF spectrometer). JEOL also manufactures amino acid analyzers, clinical biochemistry analyzers.
Nano Scan Technology.
Nano Scan Technology (scientific instrument company, Russia) is a manufacturer of instrumentation for surface characterization and microanalysis by scannig probe microscopy, optical microscopy, scanning confocal laser microscopy, Raman spectroscopy and fluorescence spectroscopy. Nano Scan Technology manufactures scannig probe microscope, combined scannig probe microscope + optical  microscope system, sophisticated scannig probe microscope + scanning confocal laser microscope + Raman microscope / fluorescence microscope system, scannig probe microscope + cryo-ultramicrotome system.
Shimadzu Corporation.
Shimadzu Corporation is one of the world's leading analytical instrument and scientific instrument companies, a manufacturer of analytical equipment (gas chromatography, liquid chromatography instruments and systems, portable ion chromatography systems, mass spectrometry, optical spectroscopy, X-Ray spectroscopy instruments and systems, elemental analyzers, thermal analyzers), laboratory equipment (electronic laboratory balances, analytical balances, moisture determination balances - balance moisture analyzers), measuring equipment (calorimeters, moisture meters, viscometers, rheometers, particle size analyzers, force gauges, specific gravity meters), scientific equipment (XRF spectrometers, X-ray diffractometers, surface analysis instruments: scanning electron microscopes, scanning probe microscopes), materials testing equipment (material testing machines, hardness tester systems).
Shimadzu Corporation manufactures a broad range of elemental analysis and spectroscopy equipment, instruments, systems: TC, TN, TIC, TOC analyzers (total carbon analysers, total nitrogen analyzers, total inorganic carbon analysers, total organic carbon analyzers), atomic-absorption spectrometers (flame and graphite furnace AAS instruments), spark optical emission spectrometers for metal analysis and alloy identification (OES metal analyzers), ICP spectrometers, FT-IR spectrometers and FTIR microscopes (FT-IR microanalysis systems), UV-visible spectrophotometers, fluorescence spectrometers, MALDI-TOF mass spectrometry systems, X-ray fluorescence spectroscopy and X-ray diffractometry instruments (X-ray fluorescence spectrometers and X-ray diffractometers), optical components (holographic gratings), consumable products, parts and accessories for spectroscopy and elemental analysis.
Shimadzu Corporation manufactures scanning electron microscopes (SEM systems), analytical scanning electron microscopes (SEM-EDX combined microanalysis system), scanning probe electron microscopes (SPM systems), electron probe microanalyzer (EPMA), and energy dispersive micro X-ray fluorescence spectrometer (micro-EDXRF spectrometer system).
SPECS Surface Nano Analysis GmbH.
SPECS Surface Nano Analysis GmbH (Berlin, Germany) is a manufacturer of specialized spectrometer systems for surface microanalysis and imaging (surface spectroscopy and microscopy systems). SPECS Surface Nano Analysis manufactures electron spectrometers, fully automated ESCA system, secondary ion mass spectrometry + secondary neutral mass spectrometry system (SIMS + SNMS system), X-ray  photoelectron spectrometer (ultra high resolution XPS analyzer), Auger spectrometer (AES system), electron energy loss spectrometer (EELS system), low energy electron microscopy + photoelectron emission microscopy system (LEEM + PEEM system), low energy electron diffraction analyzer (LEED surface analyzer), photoemission spectrometer, time-of-flight spectrometer, scanning tunneling spectroscopy and microscopy system (STM system). SPECS GmbH manufactures a line of high resolution hemispherical energy analyzers for electron and ion spectroscopy, non-contact atomic force microscopy instrumentation (NC-AFM system), the Joule-Thomson scanning tunneling microscope. SPECS GmbH offers customized systems combining thin film preparation (MBE) with spectroscopic and microscopic options. The company also manufactures a variety of sources for deposition, excitation and charge neutralization as well as analyzers, monochromators, detectors.
Veeco Instruments Inc.
Veeco Instruments is a manufacturer of atomic force microscopes, atomic force profiler, automated AFM / AFP systems, optical interferometric profilers, 3D confocal microscopes for metrology. Veeco Instruments manufactures atomic force microscope systems (AFM), scanning probe microscopes, (SPM systems). Veeco Instruments manufactures electrochemical scanning tunneling microscope (ECSTM - features atomic-resolution STM imaging and molecular-resolution STM imaging of electrode surfaces in solution under electrochemical control), electrochemical atomic force microscope (ECAFM - features nanometer-resolution AFM imaging of electrode surfaces in solution under electrochemical control), scanning electrochemical potential microscope (SECPM). Veeco Instruments manufactures confocal laser scanning microscopes, spinning disc confocal microscopes.
Author of the catalogue - Andrey Yurievich Zhdanov. Автор каталога - Андрей Юрьевич Жданов.
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Статистика LiveInternet (multilanguage statistics). Статистика счетчика Rambler's  Top 100.       .
Analytical and laboratory equipment companies, scientific instrument companies. Производители и поставщики аналитического и лабораторного оборудования.
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